* ELE 461 No Pass/D/Fail
Design with Nanotechnologies
Introduction to emerging technologies; FinFEts: from device to chip multiprocessor; quantum and reversible logic; nanowire based logic; carbon nanotube based logic; fault models for emerging technologies and testing; fault tolerance; 3D IC design.
Sample reading list:
Zvi Kohave and Niraj K. Jha, Switching and Finite Automata Theory, 3rd Ed.
Niraj Jha and Sandeep Gupta, Testing of Digital Systems
Dhiraj K. Pradhan, Fault-Tolerant Computer System Design
Vasilis F. Pavlidis and Eby G. Friedman, Three-Dimensional Integrated Circuit Design
Sung Kyu Lim, Design for High Performance, Low Power and
Relieable 3D Integrated Circuits
Bi-weekly problem sets, approximately 15 pp. of weekly reading, and a final paper.
Mid Term Exam - 40%
Term Paper(s) - 50%
Problem set(s) - 10%
Prerequisites and Restrictions:
ELE 206: Introduction to Logic Design.
|22160||L01||1:30 pm - 2:50 pm||T Th||Friend Center 203||Enrolled:12 Limit:15|